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Alt 30.06.2012, 11:39   Posting #1 (im Thread / einzeln)
mumpf
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Registriert seit: 25.05.2006
Beiträge: 246
IDE HD defekt?

Hatte Probleme mit meiner Samsung SP0802N Festplatte: Detecting Samsung... Primary master fails (ist ca. 8jährig, ist die HD von meinem Hauptcomputer (ca. 2-3h pro Tag im Einsatz)
Habe dann die Daten gesichtert (via dd für Linux bzw. Acronis für die Windows Partition bzw. via copy für die fat32 und ntfs Datenpartitionen) und dann via hutil
die HD low-level formatiert. Den hutil Test (dauerte ca. eine h) hat die Platte danach anstandslos bestanden (vorher surface scan Fehler).
smartctl -a /dev/sda zeigt folgendes (werde nicht recht schlau d'raus).

Code:
smartctl 5.42 2011-10-20 r3458 [i686-linux-3.4.3-1-ARCH] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint P80
Device Model:     SAMSUNG SP0802N
Serial Number:    S00JJ30X420629
Firmware Version: TK200-04
User Capacity:    80'060'424'192 bytes [80.0 GB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   7
ATA Standard is:  ATA/ATAPI-7 T13 1532D revision 0
Local Time is:    Sat Jun 30 12:24:04 2012 CEST

==> WARNING: May need -F samsung2 or -F samsung3 enabled; see manual for details.

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x04)	Offline data collection activity
					was suspended by an interrupting command from host.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		( 3000) seconds.
Offline data collection
capabilities: 			 (0x1b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					No Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					No General Purpose Logging support.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 (  50) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   100   100   051    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0007   100   100   025    Pre-fail  Always       -       4032
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       282
  5 Reallocated_Sector_Ct   0x0033   097   097   011    Pre-fail  Always       -       7
  7 Seek_Error_Rate         0x000f   100   100   051    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0025   100   100   015    Pre-fail  Offline      -       9895
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       59660
 10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0012   100   100   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       155
194 Temperature_Celsius     0x0022   115   115   000    Old_age   Always       -       41
195 Hardware_ECC_Recovered  0x001a   100   100   000    Old_age   Always       -       3186056
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x000a   100   100   051    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   100   100   051    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 2
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 496 hours (20 days + 16 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 fe 00 00 00 40  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ef 05 fe 00 00 00 40 00      00:01:39.063  SET FEATURES [Enable APM]
  c8 00 08 10 ab 06 e7 00      00:01:39.063  READ DMA
  c8 00 20 60 e0 9a e7 00      00:01:39.063  READ DMA
  c8 00 68 a8 e0 9a e7 00      00:01:39.063  READ DMA
  c8 00 28 80 e0 9a e7 00      00:01:39.063  READ DMA

Error 1 occurred at disk power-on lifetime: 494 hours (20 days + 14 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 fe 00 00 00 40  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ef 05 fe 00 00 00 40 00      00:02:00.625  SET FEATURES [Enable APM]
  ec 00 01 00 00 00 00 00      00:02:00.313  IDENTIFY DEVICE
  c8 00 08 00 00 00 e0 00      00:02:00.188  READ DMA
  c8 00 08 00 10 00 e0 00      00:02:00.000  READ DMA
  c8 00 08 20 00 00 e0 00      00:02:00.000  READ DMA

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%       494         -

Device does not support Selective Self Tests/Logging
 
Alt 30.06.2012, 15:10   Posting #2 (im Thread / einzeln)
Mac_Fly
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Benutzerbild von Mac_Fly
 
Registriert seit: 01.01.2004
Ort: irgendwo im Ruhrgebiet
Beiträge: 190
Die beiden Fehler nach 496h Laufzeit liegen ja mehrere Jahre in der Vergangenheit. Irgendwas einmaliges. Vielleicht war ein Kabel nicht ok oder der Rechner ist während eines Plattenzugriffs abgeschmiert. Irgendwie sowas. Würde ich als nicht riskant einstufen. Ist ja auch nichts mehr vorgefallen seitdem.

Allerdings wurden schon Sektoren als defekt markiert und durch Reserve ersetzt. Da ist also verstärkt Verschleiss im Spiel; wie schnell sich der jetzt fortsetzt: keine Ahnung. Falls sich das Laufgeräusch der Platte verändert hat wird es schnell gehen.

Behalte auf jeden Fall "Reallocated_Sector_Ct" bzw. "Current_Pending_Sector" im Auge. Wenn in nächster Zeit beim "Current_Pending_Sector" wieder was drinsteht sind weitere defekte Sektoren hinzugekommen, die dann bei der nächsten Formatierung ersetzt werden müssen. In dem Fall solltest Du Dich wahrscheinlich besser kurzfristig von der Platte trennen.

Falls keine neuen defekten Sektoren hinzukommen, dürfte die Platte noch 'ne Weile funktionieren.
Insgesamt geht es aber trotzdem auf das Ende zu. Wichtige Daten gehören da jedenfalls nicht mehr drauf. Mit 8 Jahre kannst Du schon zufrieden sein. Ich wäre es.

Gruesse, Mac_Fly
 
Alt 30.06.2012, 16:45   Posting #3 (im Thread / einzeln)
mumpf
Captain
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Registriert seit: 25.05.2006
Beiträge: 246
Vielen Dank für die detaillierten Informationen, Mac_Fly!
Unten die Anzeige einer zweiten 80'er, die ich noch herum liegen habe (ca. 4-5 Jahre gelaufen). Möchte den Rechner (mein Hauptrechner) halt noch ein bis zwei Jahre nutzen, darum würde ich gerne diese Platte einbauen.

Was ich nicht verstehe:
Power_On_Minutes 0x0032 244 244 000 Old_age Always - 1007h+05m

Später heisst es dann aber:
Error 28 occurred at disk power-on lifetime: 2976 hours (124 days + 0 hours)

Beim Selbsttest sudo smartctl -a /dev/sda -v 9,minutes
kommt dann aber
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 2998
Also ist die Platte 3000h gelaufen, oder?

Edit: Habe das gefunden, bringt mich aber nicht wirklich weiter, Herstellungsdatum lt. Plattenlabel ist August 2004

Die power_on_minutes können doch nicht kleiner sein als die power-on lifetime Zeit (?).



Habe dann nach deinen Hinweisen reallocated_sector bzw. current_pending_sector etwas gegoogelt und folgendes gefunden, schreibe das 'mal 'rein, falls jemand anders ähnlich irritiert ist, wie ich es war:


Reallocated Sector Count ist ja da 0 (bei der Samsung war er 7).
Siehe SMART-Wiki

"Ein kritischer Wert, der stets auf 0 stehen sollte. Haben Fehler auf der Datenträgeroberfläche bereits dazu geführt, dass ein (oder mehrere) Sektoren nicht mehr zuverlässig gelesen werden konnten, so wurde ein Ersatzsektor aus dem dafür reservierten Bereich genommen und der defekte damit ersetzt. Werte von 1 und höher zeigen also Defekte an, die erst nach der Prüfprozedur beim Hersteller aufgetreten sind."

Reallocated Event Count ist ebenfalls 0. "Ein kritischer Wert, der die Anzahl der Rettungsversuche von Daten aus unlesbaren Sektoren repräsentiert. Steigt normalerweise im gleichen Maße an wie der Wert 05. Typischer Wert: 0, da dann keine Fehler vorliegen."

"Current Pending Sector ist ja bei der Maxtor 0. "Kritischer Wert: Zeigt an, wieviele Sektoren derzeit auf der Kippe stehen und vielleicht nicht mehr gelesen werden könne. Sollte optimalerweise 0 betragen, höhere Werte lassen auf Probleme schließen. ..."

Hier noch eine weitere Erläuterung




Code:
smartctl 5.42 2011-10-20 r3458 [i686-linux-3.4.4-2-ARCH] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     Maxtor DiamondMax Plus 9
Device Model:     Maxtor 6Y080P0
Serial Number:    Y2NDTDFE
Firmware Version: YAR41BW0
User Capacity:    81'964'302'336 bytes [81.9 GB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   7
ATA Standard is:  ATA/ATAPI-7 T13 1532D revision 0
Local Time is:    Sat Jun 30 17:30:21 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(  241) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					No General Purpose Logging support.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  37) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  3 Spin_Up_Time            0x0027   226   225   063    Pre-fail  Always       -       8354
  4 Start_Stop_Count        0x0032   252   252   000    Old_age   Always       -       2073
  5 Reallocated_Sector_Ct   0x0033   253   253   063    Pre-fail  Always       -       0
  6 Read_Channel_Margin     0x0001   253   253   100    Pre-fail  Offline      -       0
  7 Seek_Error_Rate         0x000a   253   252   000    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0027   253   245   187    Pre-fail  Always       -       47014
  9 Power_On_Minutes        0x0032   244   244   000    Old_age   Always       -       1007h+05m
 10 Spin_Retry_Count        0x002b   253   252   157    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x002b   253   252   223    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   248   248   000    Old_age   Always       -       2184
192 Power-Off_Retract_Count 0x0032   253   253   000    Old_age   Always       -       0
193 Load_Cycle_Count        0x0032   253   253   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0032   253   253   000    Old_age   Always       -       21
195 Hardware_ECC_Recovered  0x000a   253   252   000    Old_age   Always       -       22721
196 Reallocated_Event_Count 0x0008   253   253   000    Old_age   Offline      -       0
197 Current_Pending_Sector  0x0008   253   253   000    Old_age   Offline      -       0
198 Offline_Uncorrectable   0x0008   253   253   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0008   199   199   000    Old_age   Offline      -       0
200 Multi_Zone_Error_Rate   0x000a   253   252   000    Old_age   Always       -       0
201 Soft_Read_Error_Rate    0x000a   253   252   000    Old_age   Always       -       1
202 Data_Address_Mark_Errs  0x000a   253   252   000    Old_age   Always       -       0
203 Run_Out_Cancel          0x000b   253   252   180    Pre-fail  Always       -       0
204 Soft_ECC_Correction     0x000a   253   252   000    Old_age   Always       -       0
205 Thermal_Asperity_Rate   0x000a   253   252   000    Old_age   Always       -       0
207 Spin_High_Current       0x002a   253   252   000    Old_age   Always       -       0
208 Spin_Buzz               0x002a   253   252   000    Old_age   Always       -       0
209 Offline_Seek_Performnce 0x0024   190   189   000    Old_age   Offline      -       0
 99 Unknown_Attribute       0x0004   253   253   000    Old_age   Offline      -       0
100 Unknown_Attribute       0x0004   253   253   000    Old_age   Offline      -       0
101 Unknown_Attribute       0x0004   253   253   000    Old_age   Offline      -       0

SMART Error Log Version: 1
Warning: ATA error count 28 inconsistent with error log pointer 5

ATA Error Count: 28 (device log contains only the most recent five errors)
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 28 occurred at disk power-on lifetime: 2976 hours (124 days + 0 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 59 08 70 fe ff ff  Error: ABRT at LBA = 0x0ffffe70 = 268435056

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  20 00 08 70 fe ff ff 00      00:21:34.176  READ SECTOR(S)
  20 00 08 00 ff ff ff 00      00:21:34.144  READ SECTOR(S)
  20 00 08 c0 ff ff ff 00      00:21:34.112  READ SECTOR(S)
  20 00 08 f8 fe ff ff 00      00:21:34.080  READ SECTOR(S)
  20 00 01 ff ff ff ff 00      00:21:34.048  READ SECTOR(S)

Error 27 occurred at disk power-on lifetime: 2976 hours (124 days + 0 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 59 08 00 ff ff ff  Error: ABRT at LBA = 0x0fffff00 = 268435200

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  20 00 08 00 ff ff ff 00      00:21:34.144  READ SECTOR(S)
  20 00 08 c0 ff ff ff 00      00:21:34.112  READ SECTOR(S)
  20 00 08 f8 fe ff ff 00      00:21:34.080  READ SECTOR(S)
  20 00 01 ff ff ff ff 00      00:21:34.048  READ SECTOR(S)
  20 00 01 fe ff ff ff 00      00:21:34.032  READ SECTOR(S)

Error 26 occurred at disk power-on lifetime: 2976 hours (124 days + 0 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 59 08 c0 ff ff ff  Error: ABRT at LBA = 0x0fffffc0 = 268435392

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  20 00 08 c0 ff ff ff 00      00:21:34.112  READ SECTOR(S)
  20 00 08 f8 fe ff ff 00      00:21:34.080  READ SECTOR(S)
  20 00 01 ff ff ff ff 00      00:21:34.048  READ SECTOR(S)
  20 00 01 fe ff ff ff 00      00:21:34.032  READ SECTOR(S)
  20 00 01 fd ff ff ff 00      00:21:34.000  READ SECTOR(S)

Error 25 occurred at disk power-on lifetime: 2976 hours (124 days + 0 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 59 08 f8 fe ff ff  Error: ABRT at LBA = 0x0ffffef8 = 268435192

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  20 00 08 f8 fe ff ff 00      00:21:34.080  READ SECTOR(S)
  20 00 01 ff ff ff ff 00      00:21:34.048  READ SECTOR(S)
  20 00 01 fe ff ff ff 00      00:21:34.032  READ SECTOR(S)
  20 00 01 fd ff ff ff 00      00:21:34.000  READ SECTOR(S)
  20 00 01 fc ff ff ff 00      00:21:33.968  READ SECTOR(S)

Error 24 occurred at disk power-on lifetime: 2976 hours (124 days + 0 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 59 01 ff ff ff ff  Error: ABRT at LBA = 0x0fffffff = 268435455

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  20 00 01 ff ff ff ff 00      00:21:34.048  READ SECTOR(S)
  20 00 01 fe ff ff ff 00      00:21:34.032  READ SECTOR(S)
  20 00 01 fd ff ff ff 00      00:21:34.000  READ SECTOR(S)
  20 00 01 fc ff ff ff 00      00:21:33.968  READ SECTOR(S)
  20 00 01 fb ff ff ff 00      00:21:33.952  READ SECTOR(S)

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
 
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